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Ravi Sankar, A.
- Experimental Analysis of the Critical Voltage of an Electrochemical Discharge Machining Process
Abstract Views :152 |
PDF Views:1
Authors
S. Saranya
1,
A. Ravi Sankar
1
Affiliations
1 School of Electronics Engineering, VIT University, Chennai Campus, IN
1 School of Electronics Engineering, VIT University, Chennai Campus, IN
Source
Manufacturing Technology Today, Vol 13, No 11 (2014), Pagination: 16-21Abstract
Electrochemical discharge machining is a recent technique in the field of non-traditional machining. This process is capable of machining insulators like glass and ceramics. Recently many researches are being carried out on this technique to obtain an optimal machining condition. However, many aspects of this technology demand an extensive research and development in this field. However, now many aspects of this machining technology still demand further extensive in-depth research and development. In this paper, the process of electrochemical discharge machining is carried out by varying the various process parameters such as tool diameter, electrolyte type and electrolytic concentration. The spark generation voltage in each of these cases is compared. The effect of insulated tool material on the spark generation voltage is also discussed.Keywords
Electrochemical Discharge Machining, Spark Generation, Critical Voltage, Insulated Tool.- Effect of Electroplated Gold Film on the Performance of a Piezoresistive Accelerometer with Stress Concentrated Tiny Beams
Abstract Views :155 |
PDF Views:0
Authors
Affiliations
1 School of Electronics Engineering (SENSE), VIT University, Chennai - 600 127, Tamil Nadu, IN
1 School of Electronics Engineering (SENSE), VIT University, Chennai - 600 127, Tamil Nadu, IN
Source
Indian Journal of Science and Technology, Vol 8, No 19 (2015), Pagination:Abstract
Background/Objective: In the recent times, piezoresistive accelerometers have been extensively explored with the primary focus on the optimization of its sensitivity and measurement bandwidth. In this paper, the design of an in-plane deflection mode accelerometer sensor has been devised with selective deposition of gold metal on the top and both the sides of the proof mass. Methods/Statistical Analysis: The micromachined silicon accelerometer constitutes of stress concentrated tiny piezoresistor beams and a central cantilever beam to support the proof mass. In order to improve the electromechanical response of the sensor, selective deposition of the gold metal layer was performed on the top and both the sides of the proof mass. The design and modeling of the sensor has been performed utilizing a Finite Element Model (FEM) software simulation tool IntelliSuite®. Findings: Compared to the conventional designs reported in the literature, accelerometer sensors with stress concentrated tiny beams and gold layer selectively deposited on the proof mass have shown an improvement in the electrical sensitivity and the FOM (product of the sensitivity and square of the resonant frequency). Simulation results demonstrate that the accelerometer structure with gold layer atop of the proof mass has a better sensitivity and FOM than the conventional design without gold by 28.26% and 27.43% respectively. Similarly, the accelerometer structure with gold on both sides of the proof mass has shown an improvement in the sensitivity by 57.82% and the Figure Of Merit (FOM) by 29.70% compared to the structure without gold layer. Conclusion/Improvements: It has been demonstrated that the performance metrics of piezoresistive accelerometer sensors with stress concentrated tiny beams can further be improved by selective deposition of metal gold layer on the proof mass of the accelerometer structure.Keywords
Accelerometer Sensor, Electroplated Gold, In-plane Deflection, Piezoresistive Read Out, Resonant Frequency, Sensitivity- Effect of Doping Concentration on the Performance of a Thermally Actuated MEMS Resonator using Piezoresistive Readout
Abstract Views :150 |
PDF Views:0
Authors
Affiliations
1 School of Electronics Engineering (SENSE), VIT Chennai Campus, VIT University, Chennai-600 127, Tamil Nadu, IN
1 School of Electronics Engineering (SENSE), VIT Chennai Campus, VIT University, Chennai-600 127, Tamil Nadu, IN